Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

USD 4.99 USD

SKU: cxb433Gg

Condition: Good

Tags: 0.5in 11 oz 2009 240 Pages 30 Days 6.3in. 8.9in Buyer Computing English JOURNEY to Data Quality Money Back Nonfiction Quality Press Returns Accepted Textbook The MIT Press Trade Paperback Yang w. Lee

Categories: Books & Magazines

Specifications

Return Shipping Will Be Paid By	Buyer
All Returns Accepted	Returns Accepted
Item Must Be Returned Within	30 Days
Refund Will Be Given As	Money Back
Narrative Type	Nonfiction
Original Language	English
Topic	Computing
Item Length	8.9in.
Item Height	0.5in.
Item Width	6.3in.
Author	Yang w. Lee
Publication Name	JOURNEY to Data Quality
Format	Trade Paperback
Language	English
Publisher	The MIT Press
Publication Year	2009
Type	Textbook
Item Weight	11 Oz
Number Of Pages	240 Pages

Grab this activity book if you need something engaging and screen-free.

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Specifications

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