Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
USD 4.99 USD
Specifications
| Return Shipping Will Be Paid By | Buyer |
| All Returns Accepted | Returns Accepted |
| Item Must Be Returned Within | 30 Days |
| Refund Will Be Given As | Money Back |
| Narrative Type | Nonfiction |
| Original Language | English |
| Topic | Computing |
| Item Length | 8.9in. |
| Item Height | 0.5in. |
| Item Width | 6.3in. |
| Author | Yang w. Lee |
| Publication Name | JOURNEY to Data Quality |
| Format | Trade Paperback |
| Language | English |
| Publisher | The MIT Press |
| Publication Year | 2009 |
| Type | Textbook |
| Item Weight | 11 Oz |
| Number Of Pages | 240 Pages |
Grab this activity book if you need something engaging and screen-free.
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